Protoflex
Quantum Efficiency Measurement System
Need to know how good your solar cells are? ProtoFlex’s Quantum Efficiency (QE) Measurement System combines highly accurate measurements with ease of use and customizable options. The QE Measurement System provides fully automated measurement of external quantum efficiency, with absolute accuracy of ±5% over a wavelength range of 350-1800 nm. The QE system can also measure specular transmission.
We recommend the QE1100 for measuring silicon cells, and the QE1400 for measuring CdTe, a-Si, and CIGS cells, and QE1800 for measuring GaAs cells.
System Specifications
Area: 15 cm x 15 cm (6”x 6”)
Wavelength range:
QE1100 350-1100 nm
QE1400 350-1400 nm
QE1800 350-1800 nm
Accuracy: ±5%
Contact probes: 4-point
Sample stage: fixed plate
Light source: 75 watt quartz tungsten bulbs
Amplifier: lock-in amplifier for AC measurements
Automatic order sorting filters
Two calibrated reference detectors
Options for reflectance, light bias and voltage bias
Hardware Features
Compact electronics/hardware
Low-cost tungsten halogen source
1/8 meter direct drive monochromator
Dual beam for intensity monitoring
Chopped monochromatic measurement
For measuring the following materials
Amorphous silicon (a-Si)
Copper indium diselenide (CIS)
Copper indium gallium diselenide (CIGS)
Cadmium sulfide (CdS)
Cadmium telluride (CdTe)
Mono & multi-crystalline Silicon
